XPS characterization of the passive films formed on nanocrystalline nickel in sulphuric acid
- 1 January 1994
- journal article
- Published by Elsevier in Nanostructured Materials
- Vol. 4 (1), 69-78
- https://doi.org/10.1016/0965-9773(94)90129-5
Abstract
No abstract availableKeywords
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