Dependence of magnetics, microstructures and recording properties on underlayer thickness in CoNiCr/Cr media
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 24 (6), 2727-2729
- https://doi.org/10.1109/20.92226
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Media noise of sputtered metallic thin film disksIEEE Translation Journal on Magnetics in Japan, 1989
- Investigation of S/N Property on Sputtered Metal FilmsIEEE Translation Journal on Magnetics in Japan, 1988
- Micromagnetic studies of thin metallic films (invited)Journal of Applied Physics, 1988
- Low-noise metal medium for high-density longitudinal recordingJournal of Applied Physics, 1988
- Noise dependence on the thickness of plated disksJournal of Applied Physics, 1987
- Film structure and magnetic properties of CoNiCr/Cr sputtered thin filmIEEE Transactions on Magnetics, 1986
- Thin films for magnetic recording technology: A reviewJournal of Vacuum Science & Technology A, 1986
- CoNiCr/Cr sputtered thin film disksIEEE Transactions on Magnetics, 1985
- Measurement of noise in magnetic mediaIEEE Transactions on Magnetics, 1983
- Signal-to-noise ratio studies on γ-Fe2O3thin film recording disksIEEE Transactions on Magnetics, 1983