Interpretation of AES depth profiles of porous Al anodic oxides
- 31 August 1980
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 5 (4), 406-425
- https://doi.org/10.1016/0378-5963(80)90105-1
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Characterization of anodized aluminium—Copper vapour-deposited films by ion scattering spectrometryCorrosion Science, 1979
- Oxide morphologies on aluminum prepared for adhesive bondingApplications of Surface Science, 1979
- STEM/EDAX Analysis of the Cell Walls in Porous Anodic Films Formed on AluminumJournal of the Electrochemical Society, 1978
- Effects of chemical and thermal treatments on the composition of 2024 aluminum adherend surfacesApplications of Surface Science, 1978
- Caracterisation par spectrometrie auger de films anodiques formes sur l'aluminiumMaterials Research Bulletin, 1977
- A study of barrier film growth on aluminium in solutions of film-promoting and aggressive ions using secondary ion mass spectrometryCorrosion Science, 1976
- Deconvolution method for composition profiling by Auger sputtering techniqueSurface Science, 1976
- Techniques for elemental composition profiling in thin filmsC R C Critical Reviews in Solid State Sciences, 1973
- Experimental Investigation of the Cylindrical Mirror Analyzer with a 2π-Thermionic Electron SourceJournal of Vacuum Science and Technology, 1972
- Structural Features of Oxide Coatings on AluminumJournal of the Electrochemical Society, 1953