Scanning maxwell stress microscope for nanometre-scale surface electrostatic imaging of thin films
- 1 April 1994
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 242 (1-2), 33-39
- https://doi.org/10.1016/0040-6090(94)90497-9
Abstract
No abstract availableKeywords
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