A proton semi-microbeam device for surface analysis
- 15 April 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 142 (1-2), 51-54
- https://doi.org/10.1016/0029-554x(77)90807-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Scanning Proton-Induced X-ray Microspectrometry in an Atmospheric EnvironmentScience, 1975
- Proton-induced X-ray analysis of steel surfaces for microprobe purposesNuclear Instruments and Methods, 1975
- The use of focused ion beams for analysisThin Solid Films, 1973
- Proton microbeams, their production and useJournal of Radioanalytical and Nuclear Chemistry, 1972
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- Rutherford scattering and channeling. Useful combination for chemical analysis of surfacesAnalytical Chemistry, 1969