A Technique for Sampling Oxide Layers and Brittle Materials for Microdiffraction
- 1 April 1960
- journal article
- Published by Springer Nature in Nature
- Vol. 186 (4719), 147-148
- https://doi.org/10.1038/186147a0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Micro-Analysis of Metals by Optical Emission SpectroscopyApplied Spectroscopy, 1959
- Microscope Attachment for Accurate Microdrilling and the Removal of Analytical Samples from Small AreasReview of Scientific Instruments, 1958
- Evaporated carbon films for use in electron microscopyBritish Journal of Applied Physics, 1954