Differential scanning calorimetry study of solid-state amorphization in multilayer thin-film Ni/Zr
- 9 March 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 50 (10), 566-568
- https://doi.org/10.1063/1.98136
Abstract
Differential scanning calorimetry (DSC) has been used to study solid‐state amorphization and subsequent crystallization in sputtered multilayer Ni/Zr thin films. Initial results provide quantitative information about the thermodynamics and kinetics of these processes. An analysis of DSC data enables the activation energy and pre‐exponential factor for interdiffusion of Ni and Zr in a‐NiZr to be found.Keywords
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