Instability mechanisms in amorphous silicon thin film transistors and the role of the defect pool
- 1 January 1991
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 137-138, 1215-1220
- https://doi.org/10.1016/s0022-3093(05)80342-4
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
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