Effect of Hole Trapping on the Microscopic Structure of Oxygen Vacancy Sites in a-SiO2
- 1 May 2000
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry A
- Vol. 104 (20), 4699-4703
- https://doi.org/10.1021/jp994160c
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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