Life testing: Estimating the parameters of the Weibull distribution

1 March 1963

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 51 (3), 509
https://doi.org/10.1109/PROC.1963.1932

Abstract

Summary form only. An abstract of the above-titled article, taken from the 1963 IEEE International Convention (held March 25-28, New York, NY, USA), is presented.

Keywords

LIFE TESTING
LIFE ESTIMATION
PARAMETER ESTIMATION
WEIBULL DISTRIBUTION

Cited by 4 articles