Ellipsometric Determination of the Film Thickness and Conductivity during the Passivation Process on Nickel
- 15 March 1965
- journal article
- research article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 42 (6), 2246-2248
- https://doi.org/10.1063/1.1696277
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Optical Measurements on Thin Films of Condensed Gases at Low Temperatures*Journal of the Optical Society of America, 1959
- The investigation of thin surface films on metals by means of reflected polarized lightTransactions of the Faraday Society, 1933