The preparation of field‐ion‐microscope specimens containing grain boundaries
- 2 August 1971
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 94 (1), 63-67
- https://doi.org/10.1111/j.1365-2818.1971.tb02361.x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The metallurgical applications of the field-ion microscopeSurface Science, 1970
- Grain boundaries as sinks for dislocationsPhilosophical Magazine, 1970