An Improved Method for Standardization of Microspectrofluorometers

Abstract
The use of meshed cadmium-zinc sulfide fluorescent particles in combination with an electron microscope locator grid greatly facilitates the standardization of miam spectrofluorometers. The fluorescent particles emit maximally at 570 nm, and the intensity of fluorescence is directly proportional to cross-sectional area when epi-illumination is used Details concerning technique and fluorescent particle characteristics are reported.