On the Cause of Errors in Reflectance vs Angle of Incidence Measurements and the Design of Reflectometers to Eliminate the Errors
- 1 December 1967
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 6 (12), 2140-2150
- https://doi.org/10.1364/ao.6.002140
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.This publication has 16 references indexed in Scilit:
- Optical Properties of Evaporated Iridium in the Vacuum Ultraviolet from 500 Å to 2000 Å *†Journal of the Optical Society of America, 1967
- Accurate Method for Determining Photometric LinearityApplied Optics, 1966
- Errors in using the Reflectance vs Angle of Incidence Method for Measuring Optical Constants*Journal of the Optical Society of America, 1965
- Digital Evaluation of the Complex Index of Refraction from Reflectance Data*Journal of the Optical Society of America, 1965
- Irradiance Linearity Corrections for Multiplier PhototubesApplied Optics, 1964
- Apparatus for the Measurement of Vacuum Ultraviolet Optical Properties of Freshly Evaporated Films before Exposure to AirJournal of the Optical Society of America, 1961
- Relation Between Surface Roughness and Specular Reflectance at Normal IncidenceJournal of the Optical Society of America, 1961
- Fluorescent Sensitized Photomultipliers for Heterochromatic Photometry in the UltravioletJournal of the Optical Society of America, 1951
- A Monochromator for the Vacuum UltravioletJournal of the Optical Society of America, 1951
- Multiplier Photo-Tube Characteristics: Application to Low Light Levels*Journal of the Optical Society of America, 1947