A Method for the Rheological Characterization of Thick-Film Pastes
- 1 June 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 2 (2), 232-239
- https://doi.org/10.1109/tchmt.1979.1135447
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- New Approach to Enhance the Yield Stress of Electro‐Rheological Fluids by Polyaniline‐Coated Layered Silicate NanocompositesMacromolecular Rapid Communications, 2001
- The Influence of Viscometer Design on Non-Newtonian MeasurementsAnalytical Chemistry, 1960