Studies of temperature effects in AC thin-film EL devices

1 June 1981

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 28 (6), 703-708
https://doi.org/10.1109/T-ED.1981.20416

Abstract

The effect of temperature variation of ZnS:Mn AC thin-film EL (ACTFEL device characteristics has been investigated. Systematic observations of electrical and optical properties are used to clarify some of the physical processes in these devices.

Keywords

THIN FILM
ZNS
ELECTRICAL
TEMPERATURE EFFECTS
CLARIFY
ACTFEL
AC THIN
FILM EL

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