Steady-state thermal conductivity measurements of AlN and SiC substrate materials
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 12 (4), 543-547
- https://doi.org/10.1109/33.49013
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Translucent A1N Ceramic SubstrateIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1986
- Comparison of Data for Thermal Diffusivity Obtained by Laser‐Flash Method Using Thermocouple and PhotodetectorJournal of the American Ceramic Society, 1985
- Flash Method of Determining Thermal Diffusivity, Heat Capacity, and Thermal ConductivityJournal of Applied Physics, 1961