Band structure of thin films
- 15 May 1975
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 11 (10), 3761-3768
- https://doi.org/10.1103/physrevb.11.3761
Abstract
We present the formalism of a multiple-scattering technique for computing the bound energy eigenstates in a thin film. The potential is of the muffin-tin variety within the film and is a function of the normal coordinate in the exterior region. An application to a monolayer film of copper is presented, and the results compared to previous calculations.Keywords
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