Diffuse-Neutron-Scattering Measurements of the Fractional Occupancy of the Localized4f1Configuration in Ce-Th and CeAl3

Abstract
Diffuse-neutron-scattering measurements at 2<T<300 K have been employed to determine the fractional occupancy η of the localized 4f1 configuration. For CeAl3, η=0.91.0 at 11 K. For Ce0.8 Th0.2, η=0.4±0.1 at 11 K. No evidence of a compensating conduction-electron polatization was observed.