The effect of finite resolution on the determination of diffusion coefficients by the field emission fluctuation method
- 2 March 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 167 (2-3), 493-501
- https://doi.org/10.1016/0039-6028(86)90719-3
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Anisotropy in surface diffusion: Oxygen, hydrogen, and deuterium on the (110) plane of tungstenSurface Science, 1985
- Diffusion coefficients and the time auto-correlation function of density fluctuationsSurface Science, 1981
- Mobility of oxygen on the (110) plane of tungstenSurface Science, 1979
- Current fluctuations from small regions of adsorbate covered field emitters: A method for determining diffusion coefficients on single crystal planesSurface Science, 1973