A theoretical study of the sensitivities of some normal incidence methods for measuring the optical constants and thicknesses of thin films
- 1 March 1967
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 18 (3), 277-284
- https://doi.org/10.1088/0508-3443/18/3/304
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Errors in using the Reflectance vs Angle of Incidence Method for Measuring Optical Constants*Journal of the Optical Society of America, 1965
- Comparison of Reflection Methods for Measuring Optical Constants without Polarimetric Analysis, and Proposal for New Methods based on the Brewster AngleProceedings of the Physical Society, 1961
- Die Bestimmung der optischen Konstanten und der Schichtdicke beliebig dicker Schichten mit Hilfe der absoluten PhaseThe European Physical Journal A, 1952