Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
- 4 April 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 60 (14), 1406-1409
- https://doi.org/10.1103/physrevlett.60.1406
Abstract
A new technique for spectroscopic investigation of subsurface interface electronic structure has been developed. The method, ballistic electron emission microscopy (BEEM), is based on scanning tunneling microscopy. BEEM makes possible, for the first time, direct imaging of subsurface interface properties with nanometer spatial resolution. We report on the first application of BEEM to subsurface Schottky-barrier interfaces.Keywords
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