The effect of noise upon a method of frequency measurement
- 1 June 1958
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Information Theory
- Vol. 4 (2), 83-88
- https://doi.org/10.1109/tit.1958.1057442
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Short-Time Frequency Measurement of Narrow-Band Random Signals by Means of a Zero Counting ProcessJournal of Applied Physics, 1955
- The Statistical Properties of the Output of a Frequency Sensitive DeviceJournal of Applied Physics, 1954
- Short-Time Frequency Measurement of Narrow-Band Random Signals in the Presence of Wide-Band NoiseJournal of Applied Physics, 1954
- Statistical Properties of a Sine Wave Plus Random NoiseBell System Technical Journal, 1948
- Mathematical Analysis of Random NoiseBell System Technical Journal, 1945
- Mathematical Analysis of Random NoiseBell System Technical Journal, 1944
- Generalized harmonic analysisActa Mathematica, 1930