A New Technique of X-Ray Diffraction Microscopy of Scanning Type

Abstract

A new technique of the scanning method is proposed for obtaining an undistorted image in the X-ray diffraction microscopy, where, in contrast to the usual Lang method, the specimen is movable in a appropriate direction while the photographic plate is at rest. This technique gives same image in size as the specimen for any diffracting plane employed. With use of X-rays of appropriate wavelengths, diffraction topographs of the same (hkl) plane in both the Bragg and Laue cases can be obtained. Experimental results and application of this technique are described.