Coherence length and/or transfer width?
- 2 February 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 81 (1), 57-68
- https://doi.org/10.1016/0039-6028(79)90505-3
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Quantitative island size determination in the chemisorbed layer W(110) p(2 × 1)-O: I. Instrument response function and substrate perfectionSurface Science, 1979
- The LEED Instrument Response FunctionReview of Scientific Instruments, 1971
- The coherence area in low-energy electron diffractionPhysics Letters A, 1967
- Scattering Factors and Other Properties of Low-Energy Electron DiffractionJournal of Applied Physics, 1963
- Scattering of Helium and Argon from the Cleavage Plane of Lithium FluorideThe Journal of Chemical Physics, 1962
- Low-Energy Electron Diffraction Study of Silicon Surface StructuresThe Journal of Chemical Physics, 1962
- The Reflection of Atomic Beams from Sodium Chloride CrystalsPhysical Review B, 1932
- Monochromasierung der de Broglie-Wellen von MolekularstrahlenThe European Physical Journal A, 1932
- Diffraction of Hydrogen AtomsPhysical Review B, 1931
- Beugung von MolekularstrahlenThe European Physical Journal A, 1930