Microwave Thickness Detector
- 1 March 1960
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 31 (3), 313-316
- https://doi.org/10.1063/1.1716964
Abstract
A device is described which is capable of continuously measuring the thickness of moving conducting materials. The details of two independent methods, one utilizing the amplitude and one the phase of reflected microwave energy, are explained and compared. Experimental results verify that increments of the order of 1/40 mm are clearly detectable.This publication has 1 reference indexed in Scilit:
- Microwaves used to observe commutator and slip ring surfaces during operationElectrical Engineering, 1954