Entrance Windows in Germanium Low-Energy X-Ray Detectors
- 1 January 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 24 (1), 53-60
- https://doi.org/10.1109/tns.1977.4328642
Abstract
We have found experimentally that high-purity Ge low-energy X-ray detectors have a relatively thick entrance window which renders them practically useless below ~ 2.3 KeV. A simple X-ray fluorescence experiment establishes clearly that the window is physically in the Ge material itself. Experiments with detectors made from different Ge crystals, and with Schottky barrier contacts of different metals indicate that the effect is due to a basic property of the transport of electrons near a surface. Theoretical considerations and a Monte Carlo calculation show that the window is caused by the escape of warm electrons which are the end product of a photo event. The mean free path of the electrons becomes longer as they lose energy by optical phonon collisions and they can be trapped at the surface before they are picked up by the electric field.Keywords
This publication has 8 references indexed in Scilit:
- Some aspects of detectors and electronics for X-ray fluorescence analysisNuclear Instruments and Methods, 1977
- Properties of Metal Surface Barriers on High Purity GermaniumIEEE Transactions on Nuclear Science, 1975
- Accurate Measurement of Noise Parameters in Ultra-Low Noise Opto-Feedback Spectrometer SystemsIEEE Transactions on Nuclear Science, 1975
- Hole-Electron Production in SemiconductorsJournal of Applied Physics, 1971
- Negative differential mobility of electrons in germanium: A Monte Carlo calculation of the distribution function, drift velocity and carrier population in the (111) and (100) minimaJournal of Physics C: Solid State Physics, 1971
- Influence of carrier diffusion effects on window thickness of semiconductor detectorsNuclear Instruments and Methods, 1970
- An Ag–GaAs Schottky-Barrier Ultraviolet DetectorJournal of Applied Physics, 1969
- MEASUREMENT OF THE VELOCITY FIELD CHARACTERISTIC OF ELECTRONS IN GERMANIUMApplied Physics Letters, 1968