Electron Microscopy at High Beam Accelerating Voltages
- 1 July 1962
- journal article
- Published by Springer Nature in Nature
- Vol. 195 (4837), 140-141
- https://doi.org/10.1038/195140a0
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A new calculation of electron scattering cross sections and a theoretical discussion of image contrast in the electron microscopeProceedings of the Physical Society, 1962
- Theoretical Limiting Thicknesses for Single Scattering in Electron MicroscopyNature, 1960
- Specimen thickness and image resolution in electron microscopyBritish Journal of Applied Physics, 1956
- Zur Streuung mittelschneller Elektronen in kleinste WinkelZeitschrift für Naturforschung A, 1954