Evaluation of Kodak Electron Image Plates for Accurate Exposure Measurements in Electron Diffraction
- 1 December 1970
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (13), 5344-5346
- https://doi.org/10.1063/1.1658678
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Effect of Bond Formation on Electron Scattering Cross Sections for MoleculesThe Journal of Chemical Physics, 1967
- Image Recording in Electron MicroscopyJournal of the Optical Society of America, 1967
- On the Density—Intensity Calibration in Electron Diffraction StudiesThe Journal of Chemical Physics, 1963
- Structure analysis of single crystals by electron diffraction. I. TechniquesActa Crystallographica, 1953
- The Calibration of Photographic Emulsions for Electron Diffraction InvestigationsJournal of Applied Physics, 1953
- Internal Motion and Molecular Structure Studies by Electron Diffraction. II. Interpretation and MethodThe Journal of Chemical Physics, 1950