Quantitative Raman Scattering from Acceptors in GaAs
- 1 January 1987
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Residual acceptor assessment in as-grown bulk GaAs by Raman and selective pair luminescence spectroscopy: A comparative studyApplied Physics Letters, 1986
- Raman scattering as a quantitative tool for residual acceptor assessment in semi-insulating GaAsApplied Physics Letters, 1986
- Electronic Raman spectra of shallow acceptors in semi-insulating GaAsPhysical Review B, 1985