Characterization of Ga1−xAlxAs/GaAs superlattices and thin single layers by X-ray diffraction
- 16 January 1988
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 105 (1), 197-205
- https://doi.org/10.1002/pssa.2211050121
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Some aspects of the X-ray structural characterization of (Ga1?xAlxAs)n1(GaAs)n2/GaAs(001) superlatticesJournal of Applied Crystallography, 1984
- The Theory of Dynamical X-Ray Diffraction on a SuperlatticePhysica Status Solidi (b), 1983
- Limits of the X-Ray Collimation by One Asymmetrical Bragg ReflectionZeitschrift für Naturforschung A, 1982
- X-ray diffraction study of a one-dimensional GaAs–AlAs superlatticeJournal of Applied Crystallography, 1977
- X-ray diffraction from one-dimensional superlattices in GaAs1−xPxcrystalsJournal of Applied Crystallography, 1973