Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)
- 1 June 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (6S)
- https://doi.org/10.1143/jjap.32.2980
Abstract
We have constructed an atomic force microscope (AFM) operating under an ultrahigh vacuum (UHV). We have imaged the cleaved (100) surface of LiF ionic crystal to clarify the AFM's performance. As a result, for the first time, we have obtained atomically resolved AFM images of atomic defects penetrating the surface. This result seems to suggest that the cleaved LiF (100) surface was imaged under the condition of monoatomic or small cluster tip-sample interaction.Keywords
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