A simple axially-symmetric quadrupole SIMS spectrometer
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3), 535-541
- https://doi.org/10.1016/0029-554x(78)90922-9
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Ion and electron trajectories in mirror-type ion-electron convertersNuclear Instruments and Methods, 1976
- Quadrupoles for secondary ion mass spectrometryInternational Journal of Mass Spectrometry and Ion Physics, 1975
- Ion microprobe analysers. History and outlookAnalytical Chemistry, 1974
- A Simple, Inexpensive SIMS ApparatusReview of Scientific Instruments, 1973
- A low background secondary ion mass spectrometer with quadrupole analyserInternational Journal of Mass Spectrometry and Ion Physics, 1973
- Application of an Energy Selective Detector to the Sputtering Analysis of SolidsReview of Scientific Instruments, 1971
- Design of a combined ion and electron microprobe apparatusInternational Journal of Mass Spectrometry and Ion Physics, 1971
- Detector for the Metastable Ions Observed in the Mass Spectra of Organic CompoundsReview of Scientific Instruments, 1968
- Ion Microprobe Mass AnalyzerJournal of Applied Physics, 1967
- Eine neue Methode zur Messung extrem kleiner Ionenströme im HochvakuumThe European Physical Journal A, 1956