X-Ray Investigation of Solid Helium
- 15 March 1970
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (4), 1451-1454
- https://doi.org/10.1063/1.1659055
Abstract
Specimens of hcp 4He used for thermal conductivity measurements have been examined by an x‐ray method. This method is described and several Laue photographs are shown. These photographs are an excellent test of specimen quality. The number of reflections observed for high‐quality crystals is sufficient for orientation determinations.Keywords
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