Experimental S/S and /CF Electron-Attachment Cross Sections in the Energy Range 0-200 meV
- 8 June 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 46 (23), 1511-1514
- https://doi.org/10.1103/physrevlett.46.1511
Abstract
Experimental cross sections for the electron-attachment processes for S/S and /CF are reported in the energy range 0-200 meV by normalizing each attachment line shape to measurement of a thermal rate coefficient. When the same ion states are detected, good agreement is found between present values, for which a monoenergetic electron source is used, and swarm-unfolded results. The present data constitute a new limit for cross sections reported at high resolution at the lowest electron energy.
Keywords
This publication has 11 references indexed in Scilit:
- Electron attachment to chlorofluoromethanes using the electron-swarm methodThe Journal of Chemical Physics, 1980
- Dielectric properties for SF6 and SF6 mixtures predicted from basic dataJournal of Applied Physics, 1979
- Line shapes for attachment of threshold electrons to SF6 and CFCl3: Threshold photoelectron (TPSA) studies of Xe, CO, and C2H2The Journal of Chemical Physics, 1979
- Electron attachment to perfluorocarbon compounds. I. c-C4F6, 2-C4F6, 1,3-C4F6, c-C4F8 and 2-C4F8The Journal of Chemical Physics, 1979
- Ionization of xenon atoms in high Rydberg states by collision with moleculesThe Journal of Chemical Physics, 1977
- Absolute Measurements of Collisional Ionization of Xenon Atoms in Well-Defined High Rydberg StatesPhysical Review Letters, 1976
- Reactions of Highly Excited Atoms with Molecules A**+BC→A++B+C-Journal of the Physics Society Japan, 1972
- Cross Sections for Electron Attachment Resonances Peaking at Subthermal EnergiesThe Journal of Chemical Physics, 1971
- Electron Attachment to SF6The Journal of Chemical Physics, 1970
- Collisional Ionization of Long-Lived Highly Excited AtomsThe Journal of Chemical Physics, 1967