Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer Calibration
- 1 September 1988
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 59, 909-914
- https://doi.org/10.1109/euma.1988.333924
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979
- A New Procedure for System Calibration and Error Removal in Automated S-Parameter MeasurementsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1975
- Linear networks as Möbius transformations and their invariance propertiesProceedings of the IEEE, 1971