An X-ray diffraction study on artificial multilayered structure
- 1 January 1988
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 65 (1), 1-5
- https://doi.org/10.1016/0038-1098(88)90574-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- SMALL-ANGLE X-RAY DIFFRACTION STUDY OF AMORPHOUS MULTILAYER AND SINGLE LAYER THIN FILMSActa Physica Sinica, 1987
- Progress in multilayer devices as X‐ray optical elementsJournal of Microscopy, 1985
- Multilayers observed by transmission electron microscopyThin Solid Films, 1983
- Scattering factors computed from relativistic Dirac–Slater wave functionsActa Crystallographica, 1965