Imaging in amorphous materials by structural alteration
- 1 June 1972
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 8-10, 892-898
- https://doi.org/10.1016/0022-3093(72)90243-8
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Reversible optical effects in amorphous semiconductorsJournal of Non-Crystalline Solids, 1972
- RAPID REVERSIBLE LIGHT-INDUCED CRYSTALLIZATION OF AMORPHOUS SEMICONDUCTORSApplied Physics Letters, 1971
- Reversible structural transformations in amorphous semiconductors for memory and logicMetallurgical Transactions, 1971
- Analog models for information storage and transmission in physiological systemsMaterials Research Bulletin, 1970
- Reflectivity studies of the Te(Ge, As)-based amorphous semiconductor in the conducting and insulating statesJournal of Non-Crystalline Solids, 1970
- An introduction to ovonic researchJournal of Non-Crystalline Solids, 1970
- Amorphous-Semiconductor SwitchingScientific American, 1969