A new technique for the scanning and absolute calibration of electron energy loss spectra
- 31 December 1981
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 6 (1), 287-289
- https://doi.org/10.1016/s0304-3991(81)80210-0
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Variation of the Axial Aberrations of Electron Lenses with Lens StrengthJournal of Applied Physics, 1942