Effect of series resistance on the forward current-voltage characteristics of Schottky diodes in the presence of interfacial layer
- 1 January 1996
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 39 (1), 83-87
- https://doi.org/10.1016/0038-1101(95)00093-9
Abstract
No abstract availableKeywords
This publication has 26 references indexed in Scilit:
- A systematic approach to the measurement of ideality factor, series resistance, and barrier height for Schottky diodesJournal of Applied Physics, 1992
- Parameter extraction from non-ideal C−V characteristics of a Schottky diode with and without interfacial layerSolid-State Electronics, 1992
- Schottky diode: Comments concerning the diode parameters determination from the forward I-V plotJournal of Applied Physics, 1988
- Characterization of Schottky barrier diodes by means of modulation techniqueJournal of Applied Physics, 1988
- Generalized Norde plot including determination of the ideality factorJournal of Applied Physics, 1986
- Study of forward I-V plot for Schottky diodes with high series resistanceJournal of Applied Physics, 1985
- Forward I-V plot for nonideal Schottky diodes with high series resistanceJournal of Applied Physics, 1985
- Relation between current-voltage characteristics and interface states at metal-semiconductor interfacesApplied Physics Letters, 1983
- The structure and properties of metal-semiconductor interfacesSurface Science Reports, 1982
- A modified forward I-V plot for Schottky diodes with high series resistanceJournal of Applied Physics, 1979