The origin of specimen contamination in the electron microscope
- 1 April 1953
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 4 (4), 101-106
- https://doi.org/10.1088/0508-3443/4/4/302
Abstract
Electron beam contamination has been studied in simple vacuum systems to determine how it originates and methods by which it may be prevented. It is concluded that the contamination is formed by the interaction of the electrons with organic molecules adsorbed on the bombarded surfaces, the molecules being replenished from the vapour phase. Contamination may be prevented by heating the bombarded surface or surrounding it with an efficient cold trap.Keywords
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