Charge Storage on Thin SrTiO3 Film by Contact Electrification
- 1 September 1994
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 33 (9S)
- https://doi.org/10.1143/jjap.33.5573
Abstract
Charge storage on thin SrTiO3 (STO) film was investigated by contact electrification. An atomic force microscope (AFM) biased by the voltage was used to deposit the charges by contact electrification and to detect electrostatic force change induced by contact electrified charges. As a result, writing, reading and erasing were demonstrated successfully with a small pattern, small letters and small dot arrays. Besides, two adjacent positive charge dots were discriminated with separation as small as ∼63 nm. These results revealed the potential capability of the present system, i.e., contact electrification on STO film with a biased AFM, for high-density charge storage.Keywords
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