Abstract
A probe-hole technique for measuring and mapping electron emission from metal surfaces (e.g. contacts from used vacuum switches) has been developed for use in situ in a scanning electron microscope. A single emitting region can be selected and its voltage/current characteristic measured. Visual evidence is shown of 'conditioning' and electrode by voltage breakdown. The link between the source of pre-breakdown current and the site of a spark is confirmed in an experiment which demonstrates the accuracy of predicting the position of emission sites.