Specimen Holder for Controlled Deformation in the Elmiskop
- 1 October 1959
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 30 (10), 925-926
- https://doi.org/10.1063/1.1716385
Abstract
A specimen holder has been constructed to permit controlled deformation of thin metal films in the Siemens Elmiskop. The design details are described and the performance is illustrated.This publication has 6 references indexed in Scilit:
- Dislocation loops in quenched aluminiumPhilosophical Magazine, 1958
- Apparatus for the Deformation of Foils in an Electron MicroscopeReview of Scientific Instruments, 1958
- Electron diffraction from crystals containing stacking faults: IPhilosophical Magazine, 1957
- Dislocations and stacking faults in stainless steelProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1957
- Interference Effects in the Electron Microscopy of Thin Crystal FoilsPhysical Review B, 1956
- LXVIII. Direct observations of the arrangement and motion of dislocations in aluminiumPhilosophical Magazine, 1956