Characterization of microcrystallinity in hydrogenated silicon thin films
- 1 December 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 155 (2), 227-242
- https://doi.org/10.1016/0040-6090(87)90068-x
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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