Ellipsometric parameters of randomly rough surfaces
- 1 August 1972
- journal article
- Published by Elsevier in Optics Communications
- Vol. 5 (5), 323-326
- https://doi.org/10.1016/0030-4018(72)90024-7
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Reflection of Light by a System of Nonabsorbing Isotropic Film–Nonabsorbing Isotropic Substrate with Randomly Rough BoundariesJournal of the Optical Society of America, 1971
- Reflection of light on a system of non-absorbing isotropic film-non-absorbing isotropic substrate with rough boundariesOptics Communications, 1971
- Optical constants of rough surface by ellipsometryJournal of Physics D: Applied Physics, 1970
- Ellipsometry with rough surfaceOptics Communications, 1970
- Errors arising from surface roughness in ellipsometric measurement of the refractive index of a surfaceSurface Science, 1969
- Electrochemical Ellipsometric Study of GoldJournal of the Electrochemical Society, 1969
- Relation between the Height Distribution of a Rough Surface and the Reflectance at Normal IncidenceJournal of the Optical Society of America, 1963
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962