Parametric string edit distance and its application to pattern recognition
- 1 January 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Systems, Man, and Cybernetics
- Vol. 25 (1), 202-206
- https://doi.org/10.1109/21.362950
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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