Bias Stress Measurements on High Performance AlGaN/GaN HFET Devices
- 22 November 2001
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 188 (1), 233-237
- https://doi.org/10.1002/1521-396x(200111)188:1<233::aid-pssa233>3.3.co;2-s