High resolution microanalysis in materials science using electron energy loss measurements
- 1 November 1976
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 108 (2), 113-145
- https://doi.org/10.1111/j.1365-2818.1976.tb01086.x
Abstract
No abstract availableThis publication has 63 references indexed in Scilit:
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