Growth of Co layers on Cu(111) studied by forward-focusing angle-resolved x-ray photoemission spectroscopy and real-space imaging
- 29 October 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 65 (18), 2278-2281
- https://doi.org/10.1103/physrevlett.65.2278
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- Holographic LEEDPhysical Review Letters, 1990
- X-Ray photoelectron and auger electroo forward scattering: A new tool for surface crystallographyCritical Reviews in Solid State and Materials Sciences, 1990
- Direct experimental identification of the structure of ultrathin films of bcc iron and metastable bcc and fcc cobaltPhysical Review B, 1989
- Surface structure determination with forward focused electronsSurface Science, 1989
- Photoelectron HolographyPhysical Review Letters, 1988
- Small-atom approximation in forward- and back-scattering photoelectron spectroscopiesPhysical Review B, 1986
- Structural characterization of metal-metal interfaces by intermediate-energy Auger-electron diffractionPhysical Review B, 1985
- Importance of multiple forward scattering in medium- and high-energy electron emission and/or diffraction spectroscopiesPhysical Review B, 1985
- Focusing and diffraction effects in angle-resolved x-ray photoelectron spectroscopyPhysical Review B, 1984
- Dynamical Calculations of Angle-Resolved Ultraviolet Photoemission fromO and S on Ni(001)Physical Review Letters, 1977